Phase identification in a scanning electron microscope using backscattered electron Kikuchi patterns
نویسندگان
چکیده
منابع مشابه
Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns
Backscattered electron Kikuchi patterns (BEKP) suitable for crystallographic phase analysis can be collected in the scanning electron microscope (SEM) with a newly developed charge coupled device (CCD) based detector. Crystallographic phase identification using BEKP in the SEM is unique in that it permits high magnification images and BEKPs to be collected from a bulk specimen. The combination ...
متن کاملBackscattered Electrons Topographic Mode Problems in the Scanning Electron Microscope
The application of several backscattered electron (BSE) detectors makes it possible to separate topographic (TOPO) contrast and material (COMPO) contrast in a scanning electron microscope (SEM). The BSE signals from six p-i-n diodes were used to investigate some artifacts connected with the reconstruction of real topography. The location of these diodes has been predicted theoretically to obtai...
متن کاملthe scanning electron microscope
it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...
متن کاملBackscattered electron imaging of cultured cells: application to electron probe X-ray microanalysis using a scanning electron microscope.
We report a simple method to study the elemental content in cultured human adherent cells by electron probe X-ray microanalysis with scanning electron microscopy. Cells were adapted to grow on polycarbonate tissue culture cell inserts, washed with distilled water, plunge-frozen with liquid nitrogen and freeze-dried. Unstained, freeze-dried cultured cells were visualized in the secondary and bac...
متن کاملDiffraction Patterns Obtained by Scanning Electron Microscope
für Naturforschung in cooperation with the Max Planck Society for the Advancement of Science under a Creative Commons Attribution 4.0 International License. Dieses Werk wurde im Jahr 2013 vom Verlag Zeitschrift für Naturforschung in Zusammenarbeit mit der Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. digitalisiert und unter folgender Lizenz veröffentlicht: Creative Commons Namen...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Research of the National Institute of Standards and Technology
سال: 1996
ISSN: 1044-677X
DOI: 10.6028/jres.101.031